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 GaAs-IR-Lumineszenzdiode GaAs Infrared Emitter
Chip position
LD 261
2.4 2.1
1.9 1.7
0.5 0.4
2.7 2.5
0.25 0.15
0.7 0.6
0 ... 5
0.4 A
A Radiant sensitive area (0.4 x 0.4) 1.4 1.0 Collector (BPX 81) Cathode (LD 261)
2.1 1.5 2.54 mm spacing
3.5 3.0
3.6 3.2
1) Detaching area for tools, flash not true to size. Approx. weight 0.03 g
GEO06021
Mae in mm, wenn nicht anders angegeben/Dimensions in mm, unless otherwise specified.
Wesentliche Merkmale q GaAs-IR-Lumineszenzdiode, hergestellt im Schmelzepitaxieverfahren q Hohe Zuverlassigkeit q Gruppiert lieferbar q Gehausegleich mit BPX 81 Anwendungen q Miniaturlichtschranken fur Gleich- und Wechsellichtbetrieb q Lochstreifenleser q Industrieelektronik q "Messen/Steuern/Regeln"
Features q GaAs infrared emitting diode, fabricated in a liquid phase epitaxy process q High reliability q Available in bins q Same package as BPX 81 Applications q Miniature photointerrupters q Punched tape readers q Industrial electronics q For control and drive circuits
Typ Type LD 261 LD 261-5
Bestellnummer Ordering Code Q62703-Q395 Q62703-Q67
Gehause Package Leiterbandgehause, klares Epoxy-Gieharz, linsenformig im 2.54-mm-Raster (1/10''), Kathodenkennzeichnung: Nase am Lotspie Lead frame, transparent epoxy resin lens, solder tabs lead spacing 2.54 mm (1/10''), cathode marking: projection at solder lead
Semiconductor Group
1
1997-11-01
feo06021
LD 261
Grenzwerte (TA = 25 C) Maximum Ratings Bezeichnung Description Betriebs- und Lagertemperatur Operating and storage temperature range Sperrschichttemperatur Junction temperature Sperrspannung Reverse voltage Durchlastrom Forward current Stostrom, 10 s, D = 0 Surge current Verlustleistung Power dissipation Warmewiderstand Thermal resistance Symbol Symbol Wert Value - 40 ... + 80 80 5 50 1.6 70 750 650 Einheit Unit C C V mA A mW K/W K/W
Top; Tstg Tj VR IF IFSM Ptot RthJA RthJL
Kennwerte (TA = 25 C) Characteristics Bezeichnung Description Wellenlange der Strahlung Wavelength at peak emission IF = 50 mA, tp = 20 ms Spektrale Bandbreite bei 50 % von Imax Spectral bandwidth at 50 % of Imax IF = 50 m A, tp = 20 ms Abstrahlwinkel Half angle Aktive Chipflache Active chip area Abmessungen der aktiven Chipflache Dimension of the active chip area Abstand Chipoberflache bis Linsenscheitel Distance chip surface to lens top Symbol Symbol peak Wert Value 950 Einheit Unit nm
55
nm
15 0.25 0.5 x 0.5 1.3 ... 1.9
Grad deg. mm2 mm mm
A LxB LxW H
Semiconductor Group
2
1997-11-01
LD 261
Kennwerte (TA = 25 C) Characteristics Bezeichnung Description Schaltzeiten, Ie von 10 % auf 90 % und von 90 % auf 10 %, bei IF = 50 mA, RL = 50 Switching times, Ie from 10 % to 90 % and from 90 % to 10 %, IF = 50 mA, RL = 50 Kapazitat, VR = 0 V Capacitance Durchlaspannung Forward voltage IF = 50 mA, tp = 20 s Sperrstrom, VR = 5 V Reverse current Gesamtstrahlungsflu Total radiant flux IF = 50 mA, tp = 20 ms Temperaturkoeffizient von Ie bzw. e, IF = 50 mA Temperature coefficient of Ie or e, IF = 50 mA Temperaturkoeffizient von VF, IF = 50 mA Temperature coefficient of VF, IF = 50 mA Temperaturkoeffizient von peak, IF = 50 mA Temperature coefficient of peak, IF = 50 mA Symbol Symbol Wert Value 1 Einheit Unit s
tr, tf
Co
40
pF
VF IR
e
1.25 ( 1.4) 0.01 ( 1) 9
V A mW
TCI
- 0.55
%/K
TCV TC
- 1.5 0.3
mV/K nm/K
Gruppierung der Strahlstarke Ie in Achsrichtung gemessen bei einem Raumwinkel = 0.01 sr Grouping of radiant intensity Ie in axial direction at a solid angle of = 0.01 sr Bezeichnung Description Strahlstarke Radiant intensity IF = 50 mA, tp = 20 ms Symbol LD 261 Werte Values LD 261-5 Einheit Unit
Ie
2 ... 6.3
3.2 ... 6.3
mW/sr
Semiconductor Group
3
1997-11-01
LD 261
Relative spectral emission Irel = f ()
100 %
OHRD1938
Radiant intensity
Ie = f (IF) Ie 100 mA
OHR01039
Single pulse, tp = 20 s
e
10 2
Max. permissible forward current IF = f (TA)
80 F mA 70 60
OHR01124
rel
e (100 mA)
80
10 1
60
50 40
40
R thJL = 650 K/W
10
0
30
R thJA = 750 K/W
20
20
10
0 880
10
920 960 1000
-1
nm
1060
10 -2
10 -1
10 0
A F
10 1
0
0
20
40
60
80 C 100 TA , TL
Forward current IF = f (VF), single pulse, tp = 20 s
10 1 A
OHR01042
Permissible pulse handling capability IF = f (), TC = 25 C, duty cycle D = parameter
10 4
OHR02182
F
F mA
D=0 0,005 0,01 0,02
D= T T
F
10 0
typ.
max.
10 3 0,05 0,1 0,2
10 -1
10 2
0,5 DC
10 -2
1
1.5
2
2.5
3
3.5
4 V 4.5 VF
20 10 0 1.0
10 1 -5 10
10 -4
10 -3
10 -2
10 -1 s 10 0
OHR01878
Radiation characteristics Irel = f ()
40 30
50
0.8 60
0.6
70
0.4
80 90
0.2 0
100
1.0
0.8
0.6
0.4
0
20
40
60
80
100
120
Semiconductor Group
4
1997-11-01


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